ENVISIONNANO / PRECISION · MODULAR · CONTROLLABLE

AFM Accessory Solutions

External Light Sources · Environment Control · Sample Stages & Fixtures · Tools & Consumables · Data Processing

ABOUT

Chengdu EnvisionNano Technology Co., Ltd. specializes in AFM (Atomic Force Microscope) accessory solutions — providing precision, modular, and controllable instrument accessories and data processing software for research laboratories.

PRODUCT SOLUTIONS

Complete AFM accessory coverage

External Light Sources

Light source extension & model adaptation

5

Environment & Electrochemistry

Environment control & electrochemical cell installation

5

Sample Stages & Fixtures

Specialized sample stages & cross-section fixtures

7

Tools, Consumables & Software

Cleaning, standard samples & data processing

4

External Light Sources

Light source extension & model adaptation

MFP-3D Light Source (Bottom)

MFP-3D Light Source (Bottom)

  • Bottom illumination, magnetically attached to sample stage, supports grounding and sample bias
  • Standard FC/PC fiber interface, supports white light & laser, optional power meter
  • For PV, photocatalytic, ferroelectric, and 2D materials
MFP-3D Light Source (Side)

MFP-3D Light Source (Side)

  • Side illumination, magnetically attached to sample stage, supports grounding and sample bias
  • Standard FC/PC fiber interface, supports white light & laser, optional power meter
  • For PV, photocatalytic, ferroelectric, and 2D materials
Cypher S Light Source

Cypher S Light Source

  • Side illumination, supports white light & laser, optional power meter
  • For PV, photocatalytic, ferroelectric, and 2D materials
Cypher ES Light Source

Cypher ES Light Source

  • Bottom illumination, magnetically attached to sample stage, supports grounding and sample bias
  • Supports white light & laser, optional power meter
  • For PV, photocatalytic, ferroelectric, and 2D materials
Jupiter Light Source

Jupiter Light Source

  • Bottom illumination, magnetically attached to Chunk, supports grounding and sample bias
  • Standard FC/PC fiber interface, supports white light & laser, optional power meter
  • For PV, photocatalytic, ferroelectric, and 2D materials

Environment & Electrochemistry

Environment control & electrochemical cell installation

Cypher ES Environment Control

Cypher ES Environment Control

  • Atmosphere control supporting two different gases
  • Flow meter regulation, no impact on imaging
Cypher ES EC Cell Workbench

Cypher ES EC Cell Workbench

  • Facilitates electrochemical cell installation
  • Greatly reduces operation difficulty, improves efficiency
Cypher ES Transfer Kit

Cypher ES Transfer Kit

  • Assists installation of air-sensitive samples in glove box
  • Enables measurement in water/oxygen-free protective atmosphere
Cypher ES Humidity Generator

Cypher ES Humidity Generator

  • Increases chamber humidity
  • Compatible with humidity sensor
Cypher ES Humidity Sensor

Cypher ES Humidity Sensor

  • Humidity range 0%-100%
  • Simultaneous temperature display
  • USB powered

Sample Stages & Fixtures

Specialized sample stages & cross-section fixtures

Cypher ES Conductive Stage & Cables

Cypher ES Conductive Stage & Cables

  • For Cypher ES electrical modes
  • Magnetic attachment with special materials
Cypher S Electrical Leads

Cypher S Electrical Leads

  • Magnetic ends, convenient, minimal drift
  • Good conductivity for CAFM, KPFM, PFM, SCM
C

Cypher S Resistive Load

  • For conductive mode with very low sample resistance
  • Extended bias voltage range via added load
  • Low noise 500M or 1G ohm
MFP-3D Custom Sample Stage

MFP-3D Custom Sample Stage

  • Customizable special sample stages for MFP-3D
AFM Workbench

AFM Workbench

  • For HOPG and mica sample mounting, simplified cleaving
  • Fixture for cross-section holders
  • For magnetizing magnetic probes
Cross-Section Fixture

Cross-Section Fixture

  • Used with AFM workbench
  • Supports bias voltage application
Tilt Sample Fixture

Tilt Sample Fixture

  • Levels tilted sample surfaces
  • For sidewall roughness samples
  • 0-180° adjustment, magnetically attached

Tools, Consumables & Software

Cleaning, standard samples & data processing

Specialized Tweezers

Specialized Tweezers

  • Sample handling tweezers
  • Probe handling tweezers
UV Cleaning Generator

UV Cleaning Generator

  • UV light cleaning to remove organic contaminants
AFM Standard Samples

AFM Standard Samples

  • High-resolution: gypsum crystal, mica, HOPG
  • Conductive: CuInZnS, TiW alloy
  • KFM: interdigitated electrodes
  • PFM: PMNPT, PZT
  • MFM: duplex stainless steel, HDD, magnetic tape
Gibbs Insight

Gibbs Insight

  • Standard processing: smoothing, denoising, line removal
  • Chinese & English interface
  • Surface potential calibration, work function & field calculation
  • Pre/post illumination potential & work function analysis
  • Custom feature development

COMPATIBLE MODELS

Supporting mainstream AFM platforms

MFP-3D
Cypher S
Cypher ES
Jupiter

Gibbs Insight

AFM data analysis software for processing, calibration, and visualization

Gibbs Insight
Composite Workflow Basic Workflow 3D Viewer
software screenshot 1 software screenshot 2 software screenshot 3

SERVICE & SUPPORT

Solution Design

Configuration matching based on AFM model and experiment goals

Custom Development

Sample stages, fixtures, optics & environment control modifications

Application Support

Installation guidance, experiment advice & data processing support

Documentation

Product manuals, operation guides & post-processing workflows

CONTACT

Chengdu EnvisionNano Technology Co., Ltd.

Chengdu, China

Email: contact@envnano.com

For product materials, custom solutions, or application support, please contact us via email.